Themes and Goals
The Testing: Academic and Industrial Conference 2008 (TAIC PART 2008) establishes a forum for the publication of papers related to software testing and analysis. The theme of TAIC PART is transferring software testing technology from academia to industry. TAIC PART aims to forge collaborations between industry and academia. The goals of TAIC PART 2008 include the articulation of fundamental research questions in the field of software testing and analysis. TAIC PART also focuses on the practical challenges that are often faced by software developers in industry.
Call for Papers
TAIC PART 2008 solicits experience, tool, original research, industry challenge, and academic challenge papers that explore software testing and analysis techniques. Research topics include, but are not limited to, the following areas:
- Test Adequacy Criteria
- Test Suite Execution
- Test Coverage Monitoring
- Automated Test Data Generation
- Regression Testing
- Automated Debugging and Fault Localization
- Performance Evaluation
- Static and Dynamic Analysis
- Verification and Validation
- Software Reliability Engineering
- Model-Based Testing
- Testing and Formal Methods
- Testing and Model Checking
- Software Testing Process
- Technology Transfer
TAIC PART solicits papers that focus on the testing and analysis of software applications that include, but are not limited to, the following types:
- Embedded and Real-Time Systems
- Operating Systems
- Parallel, Distributed, and Cluster Applications
- Service-Oriented Software Systems
- Web Applications
- Event-Based Systems
- File and Storage Systems
- Virtual Machine-Based Applications
- Database Applications
- XML Processing Systems
- Graphical User Interfaces
- Wireless Sensor Networks
- Safety Critical Systems
- AI and Machine Learning Software
- Business Applications
Types of Papers
- Experience reports should provide practical and
generalizable insights into how to apply and extend existing
approaches to software testing and analysis.
- Tool papers must focus on the design, implementation,
and evaluation of software testing and analysis tools.
- Original Research papers will explore novel software
testing techniques. These papers should furnish a detailed
theoretical and/or empirical evaluation of the proposed
- Industry Challenge papers must have at least one author
whose affiliation in non-academic. These papers will describe a
real-world software testing problem for which help is sought
from the academic research community.
- Academic Challenge papers must have at least one author
whose affiliation in non-industry. These papers should explain a
software testing research problem for which help is sought from
All papers will undergo a rigorous examination by at least three members of the program committee. The program co-chairs and the program pommittee will provide thoughtful and fair reviews that furnish detailed insights into ways for improving and extending the papers. All submitted papers will be evaluated according to (i) relevance to the conference themes and goals and (ii) clarity and organization.
- Experience reports will be evaluated with respect
to the significance and generality of the described testing
- Research and tool papers will be judged by
the technical merit, novelty, and evaluation of the
described technique or tool.
- Industry and academic challenge papers will be
assessed according to their ability to forge partnerships
and ultimately yield successful solutions.
The results described in the submitted paper must be unpublished and should not be under review at other workshops, conferences, or journals.
Papers should be formatted using the IEEE conference style format. Including all references and figures, a research paper must not exceed the ten page limit and the experience, tool, and industry and academic challenge papers should be not longer than five pages. Papers should have an abstract that is no longer than 150 words. Please be aware that if your paper is accepted, the abstract may appear in the advance program and on the TAIC PART 2008 Web site. Authors should submit a PDF version of their paper through the Submit Paper Web site.
The accepted papers will be published with ISBN by the IEEE Computer Society and they will appear in the IEEE digital library. The presentations for all of the accepted papers will also be provided for download on the TAIC PART 2008 Web site. The Conference Chair and Program Co-Chairs have arranged for a special section of Information and Software Technology to contain extended and revised versions of selected papers from TAIC PART 2008.