Day One - Friday, August 29, 2008

10:00 Arrival and Coffee

10:30 Welcome to TAIC PART 2008

10.50 Short Break

11:00 Keynote - Les Hatton of Kingston University and Oakwood Computing

12.30 Lunch

2:00 Paper Session One - Research

Exploring the relationship of a file's history and its fault-proneness: An empirical study Timea Illes-Seifert and Barbara Paech
Alternating GUI Test Generation and Execution to Prune Test Space Xun Yuan and Atif M Memon

3:00 Tea

3:30 Paper Session Two - Industry Challenge

Testing Challenges of Maritime Safety and Security Systems-of-Systems Eric Piel
Test Axioms as Thinking Tools Paul Gerrard

4:30 Paper Session Three - Industry Experience

Selection, Evaluation and Generation of Test Cases in an Industrial Setting: a Process and a Tool Nicolas Guelfi and Benoît Ries
Abandoning Proprietary Test Tools for Graphical User Interface Verification Matthew Nicolas Kreeger and Nicholas Lativy
Zero Defect Software Development Michael Hennell

6:00 Closing Remarks

7:00 Dinner

Day Two - Saturday, August 30, 2008

8:00 Breakfast

9:00 Paper Session Four - Tools

ESTP: An Experimental Software Testing Platform Xin Feng, Simon Marr and Tony O'Callaghan
Supporting Security Testers in Discovering Injection Flaws Sven Türpe, Andreas Poller, Jürgen Repp, Jan Trukenmüller, and Christian Bornmann
Feedback-based specification, coding and testing with JWalk Anthony J H Simons, Neil Griffiths, and Christopher D. Thomson

10.30 Coffee

11:00 Paper Session Five - Industrial Experience

Improving Fault Injection of Soft Errors using Program Dependencies Gustav Munkby and Sibylle Schupp
Enhancing Test Driven Development with Model Based Testing and Performance Analysis Sebastian Wieczorek, Alin Stefanescu, Mathias Fritzsche, and Joachim Schnitter

12.00 Lunch

1:30 Walk

2:30 Tea

3:00 Paper Session - Fast Abstracts

Analysing the Impact of Change on State Machine Test Sets Sarah Salahuddin and Kirill Bogdanov
Generating Input Documents for Testing XML Queries with ToXgene Dae S. Kim-Park, Claudio de la Riva, Javier Tuya, José García-Fanjul
Validation Based on Observation of the Behavior of Distributed Components Tatiane Macedo Prudencio Lopes and Clovis Torres Fernandes
Model-Based Mutation Testing of Firewalls Tugkan Tuglular and Fevzi Belli
Co-testability Transformation Phil McMinn
Prioritizing Test Suites by Finding Hamiltonian Paths: Preliminary Studies and Initial Results Suvarshi Bhadra and Gregory M. Kapfhammer

4:30 Short Break

5:00 Keynote - David Vandervoort of Testronic Labs

6:00 Closing Remarks

7:00 Conference Banquet

Day Three - Sunday, August 31, 2008

8:00 Breakfast

9:00 Paper Session Six - Research and Tools

WebVizOr: A Visualization Tool for Applying Automated Oracles and Analyzing Test Results of Web Applications Sara Sprenkle, Holly Esquivel, Barbara Hazelwood, and Lori Pollock
MILU: A Customizable, Runtime-Optimized Higher Order Mutation Testing Tool for the Full C Language Yue Jia and Mark Harman
Web Services Composition Testing: A Strategy Based on Structural Testing of Parallel Programs André Takeshi Endo, Adenilso da Silva Simão, Simone do Rocio Senger de Souza, and Paulo Sergio Lopes de Souza

10.30 Coffee

11:00 Speed Dating

12.30 Lunch

2:00 Paper Session - Fast Abstracts

A Concept for Hybrid Fault Injection in Distributed Systems Christian Trödhandl and Bettina Weiss
Adaptive Path Selection Matthieu Petit and Phil McMinn
Finding Test Data on the Web Mustafa Bozkurt and Mark Harman
Efficient Test Case Prioritization in Regression Testing Prashant Malangave and Dinesh B. Kulkarni
Calibrating Program Slicing Metrics for Practical Use David Bowes, Steve Counsell, and Tracy Hall
Generating Test Cases from Scenario-based Formal Development Qaisar A. Malik, Johan Lilius, and Linas Laibinis
A Tool for Integrated Test Driven Development - iTDD Wolfgang Schwaiger and Martin Kropp

3:45 Tea

4:00 Panel, Next Steps, and Closing Remarks

Notice: Each full paper has twenty-five minutes for presentation and five minutes for questions. A fast abstract presentation will last ten minutes and have five minutes for questions. The conference papers are available in the bound version of the IEEE proceedings and the IEEE digital library. The fast abstracts are available for download by clicking on the title of the paper. The presentation for each paper will be available for download after the completion of TAIC PART 2008.